JS 60749-6:2007
Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature
The purpose of this part of standard is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification.
General information
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Status
Published Document (JS)
Publication date
31/01/2008
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Effiective date
01/08/2008
Number of pages
8
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