Semiconductor devices in general

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JS 60269-4:2007 Low-voltage fuses Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

This standard specifies the supplementray requirements apply fo fuse-links for application in equipment containing semiconductor devices for circuits of rated voltage up 1000 V a . c or circuits of nominal voltage up 10 1500 V d . c . (Withdrawn Document)

JS 60749-6:2007 Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature

The purpose of this part of standard is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. (Published Document (JS))